LPE growth of high Tc Bi2Sr2Ca1Cu2Ox films

✍ Scribed by A.S. Yue; S.H. Choi; H.J. Choi

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 317 KB
• Volume: 32
• Category: Article
• ISSN: 0011-2275
• DOI: 10.1016/0011-2275(92)90237-5

✦ Synopsis

X-ray diffraction patterns of the LPE-grown BSCCO films displayed a high degree of preferred orientation with their c-axes perpendicular to the a-b planes. The resistivity versus temperature data were plotted by the transport technique and a.c. mutual induction method. A series of critical temperatures, T,, at zero resistance varying from 63 k to 80 k were obtained. This variation in To is interpreted in terms of the solidification phenomena of melt-compositions along the liquidus of a pseudobinary phase diagram constructed analytically from the (Sr,Ca)O-CuO-Bi203 ternary system.