✦ LIBER ✦
Low voltage stress induced leakage current and time to breakdown in ultra-thin (1.2–2.3 nm) oxides
✍ Scribed by C. Petit; D. Zander
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 522 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0026-2714
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