Low-voltage hot-electron currents and degradation in deep-submicrometer MOSFETs : J. Chung, M.-C. Jeng, J. E. Moon, P. K. Ko and C. Hu. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 92 (1989)

• Book ID: 103285555
• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 132 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90531-q