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Low Temperature X-ray Diffraction Study of ZnCr2O4and Ni0.5Zn0.5Cr2O4

✍ Scribed by Yun Xue; Shumsun Naher; Fumiaki Hata; Hiroshi Kaneko; Haruhiko Suzuki; Yoshihiro Kino

Publisher: Springer US
Year: 2008
Tongue: English
Weight: 782 KB
Volume: 151
Category: Article
ISSN: 0022-2291
DOI: 10.1007/s10909-008-9796-4

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Single-crystal X-ray study T = 293 K Mean '(Ni±O) = 0.003 A Ê Disorder in main residue R factor = 0.024 wR factor = 0.065 Data-to-parameter ratio = 10.4 For details of how these key indicators were automatically derived from the article, see http://journals.iucr.org/e.