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Low-temperature scanning tunneling microscopy of subsurface shallow dopants: depth dependence of the corrugation for the GaAs(110) surface

✍ Scribed by A. Depuydt; C. Van Haesendonck; S.V. Savinov; V.I. Panov


Publisher
Springer
Year
2001
Tongue
English
Weight
122 KB
Volume
72
Category
Article
ISSN
1432-0630

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