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Low temperature proton induced upsets in NMOS resistive load static RAM
✍ Scribed by Stapor, W.J.; McDonald, P.T.; Swickert, S.L.; Campbell, A.B.; Massengill, L.W.; Kerns, S.E.
- Book ID
- 114554641
- Publisher
- IEEE
- Year
- 1988
- Tongue
- English
- Weight
- 533 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0018-9499
- DOI
- 10.1109/23.25504
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