Low-Temperature Fourier Transform Raman Scattering Characterization of Cd1?xZnxTe Surfaces by Different Treatments
✍ Scribed by Pei, H.Y. ;Fang, J.X.
- Publisher
- John Wiley and Sons
- Year
- 2001
- Tongue
- English
- Weight
- 106 KB
- Volume
- 188
- Category
- Article
- ISSN
- 0031-8965
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✦ Synopsis
Fourier transform Raman scattering spectra were measured for Cd 1--x Zn x Te (x = 0.04) surfaces by different treatments. By analyzing the anti-Stokes Raman spectra and correlating with surface current-voltage (I-V) curves, it is concluded that Raman measurement under low temperature is effective in characterizing the surface quality. Behaviors of phonons of the surface crystal and Te precipitates after treatment reflect surface imperfection. Te precipitate is crucial to surface quality.
2. Experiment
Cd 1--x Zn x Te single crystals were grown by vertical Bridgman technique. The starting materials were high-purity 6N Cd, 6N Zn and 6N Te with composition x = 0.04.