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Low temperature channeling measurements of ion implantation lattice disorder in single crystal silicon

✍ Scribed by Picraux, S. T.; Weisenbergers, W. H.; Vook, F. L.


Book ID
127010386
Publisher
Informa UK (Taylor & Francis)
Year
1971
Weight
691 KB
Volume
7
Category
Article
ISSN
0033-7579

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