Low resolution slit-scan pattern recognition applying one-dimensional multiparameter analysis

✍ Scribed by J.W. Betz; G.V. Sengbusch; W. HÄrtel

• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 347 KB
• Volume: 13
• Category: Article
• ISSN: 0031-3203
• DOI: 10.1016/0031-3203(81)90036-4