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Low-resolution phase extension and refinement by maximum entropy

✍ Scribed by Podjarny, A. D. ;Moras, D. ;Navaza, J. ;Alzari, P. M.

Book ID
114513130
Publisher
International Union of Crystallography
Year
1988
Tongue
English
Weight
801 KB
Volume
44
Category
Article
ISSN
0108-7673

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The maximum entropy method (MEM) is applied to the deconvolution of x-ray photoelectron spectra. This method provides the least-biased estimate of the unbroadened spectrum by using the Shannon information content as the regularizing functional. The large-scale, non-linear optimization problem is sol