Low-noise real-time measurement of the position of movable structures in MEMS
β Scribed by Giacomo Langfelder; Antonio Longoni; Federico Zaraga
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 883 KB
- Volume
- 148
- Category
- Article
- ISSN
- 0924-4247
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β¦ Synopsis
A low-noise, low-perturbing electrostatic position measurement system for capacitive MEMS sensors is described.
A small-amplitude, high-frequency voltage signal is applied between the movable and fixed plates of the sensing capacitance. The resulting current is modulated by the external forces applied to the structure. This high-frequency-shift makes it possible to filter low-noise contributes and minimize readout electrostatic perturbations on the device.
Experimental results are reported for a comb-type MEMS test structure with quasi-static, sinusoidal, and impulsive forces. Resolution and long-term stability of nanometric values have been obtained.
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