✦ LIBER ✦
Low-noise FET's vulnerability prediction under RF pulsed overloads based on nonlinear electrothermal modeling
✍ Scribed by Roizes, A.; Lazaro, D.; Quere, R.; Teyssier, J.P.
- Book ID
- 119789046
- Publisher
- IEEE
- Year
- 1999
- Tongue
- English
- Weight
- 35 KB
- Volume
- 9
- Category
- Article
- ISSN
- 1051-8207
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