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Low-frequency noise spectroscopy of polycrystalline silicon thin-film transistors

✍ Scribed by Angelis, C.T.; Dimitriadis, C.A.; Brini, J.; Kamarinos, G.; Gueorguiev, V.K.; Ivanov, T.E.

Book ID: 114537715
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 255 KB
Volume: 46
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.760405

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