✦ LIBER ✦
Low frequency noise measurements as a tool to analyze deep-level impurities in semiconductor devices
✍ Scribed by A.D. van Rheenen; G. Bosman; R.J.J. Zijlstra
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 638 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0038-1101
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