✦ LIBER ✦
Low frequency noise as a characterization tool for InP- and GaAs-based double-barrier resonant tunnelling diodes
✍ Scribed by M.J. Deen
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 599 KB
- Volume
- 20
- Category
- Article
- ISSN
- 0921-5107
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