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Low frequency noise analysis to detect the influence of deep levels in AlGaAs/GaAs st

✍ Scribed by N. Labat; D. Ouro Bodi; A. Touboul; Y. Danto; J.-M. Dumas


Book ID
112184749
Publisher
John Wiley and Sons
Year
1992
Tongue
English
Weight
321 KB
Volume
8
Category
Article
ISSN
0748-8017

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