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Low frequency noise analysis as a diagnostic tool to assess the quality of 0.25μm Ti-silicided poly lines

✍ Scribed by E.P. Vandamme; I. De Wolf; A. Lauwers; L.K.J. Vandamme


Book ID
108362375
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
381 KB
Volume
38
Category
Article
ISSN
0026-2714

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