Low frequency electromigration noise and film microstructure in Al/Si stripes: Electrical measurements and TEM analysis

✍ Scribed by C. Ciofi; A. Diligenti; F. Giacomozzi; A. Nannini; B. Neri

• Book ID: 112901518
• Publisher: Springer US
• Year: 1993
• Tongue: English
• Weight: 661 KB
• Volume: 22
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/bf02817694