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Low frequency and 1/f noise in wide-gap semiconductors: silicon carbide and gallium nitride

✍ Scribed by Levinshtein, M.E.; Rumyantsev, S.L.; Shur, M.S.; Gaska, R.; Khan, M.A.


Book ID
114447851
Publisher
The Institution of Electrical Engineers
Year
2002
Tongue
English
Weight
947 KB
Volume
149
Category
Article
ISSN
1350-2409

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