Low-field time-dependent dielectric integrity: Eugene S. Anolick and Glenn R. Nelson. IEEE Trans. Reliab. R-29 (3), 217 (August 1980)

• Book ID: 103274868
• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 115 KB
• Volume: 21
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(81)90412-1