✦ LIBER ✦
Low-field bulk defect generation during uniform carrier injection into the gate insulator of insulated gate field effect transistors at various temperatures
✍ Scribed by H. S. Kim; C. K. Williams; A. Reisman
- Publisher
- Springer US
- Year
- 1998
- Tongue
- English
- Weight
- 156 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0361-5235
No coin nor oath required. For personal study only.