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Low-Energy X-ray and Ozone-Exposure Induced Defect Formation in Graphene Materials and Devices

✍ Scribed by Zhang, En Xia; Newaz, A. K. M.; Wang, Bin; Bhandaru, Shweta; Zhang, C. Xuan; Fleetwood, Daniel M.; Bolotin, Kirill I.; Pantelides, Sokrates T.; Alles, Michael L.; Schrimpf, Ronald D.; Weiss, Sharon M.; Reed, Robert A.; Weller, Robert A.


Book ID
118214534
Publisher
IEEE
Year
2011
Tongue
English
Weight
444 KB
Volume
58
Category
Article
ISSN
0018-9499

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