✦ LIBER ✦
Low energy electron microscopy utilized in dynamic circuit analysis and failure detection on LSI-VLSI internal circuits : Louis Kotorman. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 527 (December 1983)
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 134 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0026-2714
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