๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Low energy electron beam generator for irradiation tests

โœ Scribed by Eugenio Fiorentino; Italo Giabbai; Gualtiero Giordano; Tommaso Letardi; Angelo Marino

Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
331 KB
Volume
255
Category
Article
ISSN
0168-9002

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Electron optics for dual-beam low energy
Electron optics for dual-beam low energy electron microscopy
โœ Marian Mankos ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 710 KB

Dual-beam low energy electron microscopy (LEEM) is a novel imaging technique that extends LEEM applications to non-conductive substrates. In dual-beam LEEM, two flood beams with opposite charging characteristics illuminate the field of view in order to mitigate the charging effects occurring when su

High energy ion beam irradiation of poly
High energy ion beam irradiation of polymers for electronic applications
โœ D. Fink; P.S. Alegaonkar; A.V. Petrov; M. Wilhelm; P. Szimkowiak; M. Behar; D. S ๐Ÿ“‚ Article ๐Ÿ“… 2005 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 364 KB

Ion irradiation of polymers offers a number of interesting possibilities for applications. In the case of latent tracks, radiochemical changes, phase transitions, alterations of the intrinsic free volume, or radiation induced defects can be exploited -the latter ones to trap mobile impurities. These