✦ LIBER ✦
Low-Cycle to Ultrahigh-Cycle Fatigue Lifetime Measurement of Single-Crystal-Silicon Specimens Using a Microresonator Test Device
✍ Scribed by Ikehara, T.; Tsuchiya, T.
- Book ID
- 118693178
- Publisher
- IEEE
- Year
- 2012
- Tongue
- English
- Weight
- 805 KB
- Volume
- 21
- Category
- Article
- ISSN
- 1057-7157
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