Longitudinal course of self-labeling, stigma stress and well-being among young people at risk of psychosis

✍ Scribed by Rüsch, Nicolas; Müller, Mario; Heekeren, Karsten; Theodoridou, Anastasia; Metzler, Sibylle; Dvorsky, Diane; Corrigan, Patrick W.; Walitza, Susanne; Rössler, Wulf

• Book ID: 127221332
• Publisher: Elsevier Science
• Year: 2014
• Tongue: English
• Weight: 205 KB
• Volume: 158
• Category: Article
• ISSN: 0920-9964
• DOI: 10.1016/j.schres.2014.07.016