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Long-term test-retest reliability of the P3 NoGo wave and two independent components decomposed from the P3 NoGo wave in a visual Go/NoGo task

✍ Scribed by Brunner, Jan Ferenc; Hansen, Tor Ivar; Olsen, Alexander; Skandsen, Toril; Håberg, Asta; Kropotov, Juri


Book ID
122636257
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
991 KB
Volume
89
Category
Article
ISSN
0167-8760

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