✦ LIBER ✦
Long-term reliability of Ti–Pt–Au metallization system for Schottky contact and first-level metallization on SiC MESFET
✍ Scribed by A Sozza; C Dua; A Kerlain; C Brylinski; E Zanoni
- Book ID
- 108210466
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 392 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0026-2714
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