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Long-term reliability of Al-free InGaAsP/GaAs (λ=808 nm) lasers at high-power high-temperature operation

✍ Scribed by Diaz, J.; Yi, H. J.; Razeghi, M.; Burnham, G. T.


Book ID
120507110
Publisher
American Institute of Physics
Year
1997
Tongue
English
Weight
290 KB
Volume
71
Category
Article
ISSN
0003-6951

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