Long term noise measurements and median time to failure test for the characterization of electromigration in metal lines

✍ Scribed by C. Ciofi; V. Dattilo; B. Neri; S. Foley; A. Mathewson

• Book ID: 108362460
• Publisher: Elsevier Science
• Year: 1999
• Tongue: English
• Weight: 153 KB
• Volume: 39
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(99)00174-2