✦ LIBER ✦
Long-term effects of injected electrons in tunnel oxide on the electrical characteristics of Al gate/thin oxide/Si structures—Relatively low oxide field case
✍ Scribed by Nagai, K.; Hayashi, Y.
- Book ID
- 114594440
- Publisher
- IEEE
- Year
- 1983
- Tongue
- English
- Weight
- 328 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0018-9383
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