Long range strain and electrical potential induced by single edge dislocations in GaN

✍ Scribed by N. Gmeinwieser; P. Gottfriedsen; U.T. Schwarz; W. Wegscheider; R. Clos; A. Krtschil; A. Krost; K. Engl; A. Weimar; G. Brüderl; A. Lell; V. Härle

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 233 KB
• Volume: 376-377
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/j.physb.2005.12.116