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Log-ratio technique for beam position monitor systems

โœ Scribed by G. Roberto Aiello; Mark R. Mills

Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
442 KB
Volume
346
Category
Article
ISSN
0168-9002

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โœ Malis, T. ;Cheng, S. C. ;Egerton, R. F. ๐Ÿ“‚ Article ๐Ÿ“… 1988 ๐Ÿ› Wiley (John Wiley & Sons) ๐ŸŒ English โš– 591 KB

We discuss measurement of the local thickness t of a transmission microscope specimen from the log-ratio formula t = h In (It&) where It and I0 are the total and zero-loss areas under the electron-energy loss spectrum. We have measured the total inelastic mean free path h in 11 materials of varying