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Location and reliability problems on a line: Impact of objectives and correlated failures on optimal location patterns

✍ Scribed by Berman, Oded; Krass, Dmitry; Menezes, Mozart B.C.


Book ID
119335750
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
957 KB
Volume
41
Category
Article
ISSN
0305-0483

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