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Localized states distribution and the characteristics of amorphous silicon alloy field defect transistors

✍ Scribed by Michael Shur; Choong Hyun; Michael Hack; Zvi Yaniv; Mohshi Yang; Vin Cannella


Book ID
118333634
Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
160 KB
Volume
77-78
Category
Article
ISSN
0022-3093

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