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Localization of defects in multifilamentary Nb3Sn conductors by an inductive procedure

✍ Scribed by Rupp, G.

Book ID: 114644427
Publisher: IEEE
Year: 1979
Tongue: English
Weight: 485 KB
Volume: 15
Category: Article
ISSN: 0018-9464
DOI: 10.1109/tmag.1979.1060093

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