✦ LIBER ✦
Localization and characterization of latch-up sensitive areas using a laser beam: Influence on design rules of ICs in CMOS technology
✍ Scribed by P. Fouillat; Y. Danto; J. P. Dom
- Book ID
- 112184913
- Publisher
- John Wiley and Sons
- Year
- 1993
- Tongue
- English
- Weight
- 449 KB
- Volume
- 9
- Category
- Article
- ISSN
- 0748-8017
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