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Local structural phase determination of Ni silicide thin films using EXAFS

✍ Scribed by M. A. Sahiner; P. Y. Hung; W.-Y. Loh; P. S. Lysaght; J. C. Woicik; D. Guerrero

Book ID: 115561653
Publisher: John Wiley and Sons
Year: 2012
Tongue: English
Weight: 634 KB
Volume: 9
Category: Article
ISSN: 1862-6351
DOI: 10.1002/pssc.201200250

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