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Local resistivity as an evaluation tool for thickness dependence of critical current density in YBa2Cu3O7−x coated conductors

✍ Scribed by W. Jo; R.H. Hammond; M.R. Beasley


Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
290 KB
Volume
412-414
Category
Article
ISSN
0921-4534

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