Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy

✍ Scribed by Martin Ledinský; Antonín Fejfar; Aliaksei Vetushka; Jiří Stuchlík; Jan Kočka

• Book ID: 118169618
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 801 KB
• Volume: 358
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/j.jnoncrysol.2012.01.015