Local fields near the surface of a crystalline dielectric
β Scribed by J. Lekner; P.J. Castle
- Publisher
- Elsevier Science
- Year
- 1980
- Tongue
- English
- Weight
- 326 KB
- Volume
- 101
- Category
- Article
- ISSN
- 0378-4371
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π SIMILAR VOLUMES
Surface localized defects represent a special class of microstructure in dielectric films. Whereas inhomogeneous media are often classified by volume fractions of their constituents, determinations of the local electric field require both microstructural definition and specific electric interaction
Full Structure s 1.05 s 1.10 c 0 c 0 Abs. error α 0.36 dB 0.19 dB CPU time 12.16β¬ t 1.85β¬ t 2.41β¬ t Unknowns 6080 664 760 Nonzero elements 347,904 13,312 14,816 of FE matrix surface S only 0.1 away from the periodic structure to 0 obtain a very good agreement. In all analyses, the maximum order of
## Abstract This paper presents a simplified hybrid calculation method, which enables calculation of a field very close to the surface of a perfect conducting object as well as the surface field itself. This method is based on the series electric dipole modeling (SEDM) technique, used to quickly an