Local Electrode Atom Probe Tomography: A User's Guide

✍ Scribed by David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly (auth.)

• Publisher: Springer-Verlag New York
• Year: 2013
• Tongue: English
• Leaves: 328
• Edition: 1
• Category: Library

✦ Synopsis

This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP^®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope.

✦ Table of Contents

Front Matter....Pages i-xvii
History of APT and LEAP....Pages 1-23
Specimen Preparation....Pages 25-53
Design and Instrumentation....Pages 55-77
Data Collection....Pages 79-108
Data Processing and Reconstruction....Pages 109-162
Selected Analysis Topics....Pages 163-199
Applications of the Local Electrode Atom Probe....Pages 201-247
Back Matter....Pages 249-318

✦ Subjects

Characterization and Evaluation of Materials; Nanoscale Science and Technology; Nanochemistry; Spectroscopy and Microscopy; Nanotechnology