Live and let die: LSC based verification of UML models

[IEEE 2010 17th IEEE International Confe

[IEEE 2010 17th IEEE International Conference and Workshops on Engineering of Computer Based Systems - Oxford, England (2010.03.22-2010.03.26)] 2010 17th IEEE International Conference and Workshops on Engineering of Computer Based Systems - Using UML Models and Formal Verification in Model-Based Testing

✍ Malik, Qaisar A.; Truscan, Dragos; Lilius, Johan 📂 Article 📅 2010 🏛 IEEE ⚖ 555 KB

[ACM Press the 6th International Worksho

[ACM Press the 6th International Workshop - Denver, Colorado (2009.10.05-2009.10.05)] Proceedings of the 6th International Workshop on Model-Driven Engineering, Verification and Validation - MoDeVVa '09 - Automated model-based testing using the UML testing profile and QVT

✍ Lamancha, Beatriz Pérez; Mateo, Pedro Reales; de Guzmán, Ignacio Rodríguez; Usao 📂 Article 📅 2009 🏛 ACM Press ⚖ 233 KB

[ACM Press the 6th International Worksho

[ACM Press the 6th International Workshop - Denver, Colorado (2009.10.05-2009.10.05)] Proceedings of the 6th International Workshop on Model-Driven Engineering, Verification and Validation - MoDeVVa '09 - Automated model-based testing using the UML testing profile and QVT

✍ Lamancha, Beatriz Pérez; Mateo, Pedro Reales; de Guzmán, Ignacio Rodríguez; Usao 📂 Article 📅 2009 🏛 ACM Press ⚖ 233 KB

This paper describes an approach for model-based testing which is completely based on standards, what constitutes an essential factor for its implantation in industrial software tools. The inputs of the process are models described in UML 2.0, whereas the outputs consist of artefacts of the UML Test

[IEEE 2008 16th International Conference

[IEEE 2008 16th International Conference on Advanced Computing and Communications (ADCOM) - Chennai, India (2008.12.14-2008.12.17)] 2008 16th International Conference on Advanced Computing and Communications - An Efficient Event Based Approach for Verification of UML Statechart Model for Reactive Systems

✍ Prashanth, C. M.; Shet, K. Chandrashekhar; Elamkulam, Janees 📂 Article 📅 2008 🏛 IEEE ⚖ 133 KB