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Lithographic Properties of Poly( tert -butyl methacrylate)-Based Block and Random Copolymer Resists Designed for 193 nm Wavelength Exposure Tools

✍ Scribed by Gabor, Allen H.; Pruette, Laura C.; Ober, Christopher K.


Book ID
127005367
Publisher
American Chemical Society
Year
1996
Tongue
English
Weight
367 KB
Volume
8
Category
Article
ISSN
0897-4756

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