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Lineshape asymmetry parameters in X-ray photoelectron spectra

✍ Scribed by V.G. Yarzhemsky; T. Reich; L.V. Chernysheva; P. Streubel; R. Szargan


Book ID
103738025
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
685 KB
Volume
77
Category
Article
ISSN
0368-2048

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## Abstract X‐ray (XS) and X‐ray photoelectron (XPS) spectra are reported for vanadium oxides. Because of the multivalent character of vanadium in the oxide system high quality measurements can be used for chemical shift investigation. Both inner level and valence band spectroscopy give information