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Linearization and Field Detectivity in Magnetic Tunnel Junction Sensors Connected in Series Incorporating 16 nm-Thick NiFe Free Layers

✍ Scribed by Janeiro, Ricardo J.; Gameiro, Luís; Lopes, António; Cardoso, Susana; Ferreira, Ricardo; Paz, Elvira; Freitas, Paulo P.


Book ID
120549988
Publisher
IEEE
Year
2012
Tongue
English
Weight
633 KB
Volume
48
Category
Article
ISSN
0018-9464

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