✦ LIBER ✦
Linear cofactor difference method of MOSFET subthreshold characteristics for extracting interface traps induced by gate oxide stress test
✍ Scribed by Jin He; Xing Zhang; Ru Huang; Yangyuan Wang
- Book ID
- 114539005
- Publisher
- IEEE
- Year
- 2002
- Tongue
- English
- Weight
- 119 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0018-9383
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