Linear birefringence parameters determination of a multi-order wave plate via phase detection at large oblique incidence angles
✍ Scribed by Chien-Chung Tsai; Hsiang-Chun Wei; Cheng-Hung Hsieh; Jheng-Syong Wu; Chu-En Lin; Chien Chou
- Book ID
- 104073821
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 503 KB
- Volume
- 281
- Category
- Article
- ISSN
- 0030-4018
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✦ Synopsis
In order to characterize the linear birefringence parameters (LBPs) of a multi-order wave plate (MWP) including ordinary refractive index n o , extraordinary refractive index n e and the order number precisely, phase retardation measurement by means of large oblique incidence angle on the MWP has been proposed and demonstrated. However, the effects of spatial shifting and multiple reflections by the MWP depress the accuracy of the measurements significantly. Thus, we propose a retro-reflected geometry in a polarized heterodyne interferometer that can determine the LBPs of a MWP precisely. This method is not only able to reduce the spatial shifting effect but also avoids multiple reflections of the emerging beams. Experimentally, the oblique incidence angle in a range from 30°to 44°was scanned and the highest sensitivity ever for measurements of n o and n e for an uncoated MWP was obtained. The detection sensitivity for the refractive indices (n o , n e , n o Àn e ) of an uncoated MWP can be up to 10 À6 .