Linear and Nonlinear FEL-SEW Spectroscopic Characterization of Nanometer-Thick Films

✍ Scribed by Alieva, E. V.; Beitel, G.; Kuzik, L. A.; Sigarev, A. A.; Yakovlev, V. A.; Zhizhin, G. N.; Meer, A. F. G. Van Der; Wiel, M. J. Van Der

• Book ID: 115363108
• Publisher: Society for Applied Spectroscopy
• Year: 1997
• Tongue: English
• Weight: 270 KB
• Volume: 51
• Category: Article
• ISSN: 0003-7028
• DOI: 10.1366/0003702971940657