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Line shape measurements of atoms sputtered from polycrystalline Cu, Zn, and Al by 300 keV Ar+ bombardment

✍ Scribed by R. Hippler; W. Krüger; A. Scharmann; K.-H. Schartner


Publisher
Elsevier Science
Year
1976
Weight
491 KB
Volume
132
Category
Article
ISSN
0029-554X

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